{"version":"1.0","provider_name":"WEEE Open","provider_url":"https:\/\/weeeopen.polito.it\/en","author_name":"Niccol\u00f2 Palmieri","author_url":"https:\/\/weeeopen.polito.it\/en\/author\/palmi\/","title":"Elettronica - WEEE Open","type":"rich","width":600,"height":338,"html":"<blockquote class=\"wp-embedded-content\" data-secret=\"Bb4IQYuuWP\"><a href=\"https:\/\/weeeopen.polito.it\/en\/elettronica\/\">Electronics<\/a><\/blockquote><iframe sandbox=\"allow-scripts\" security=\"restricted\" src=\"https:\/\/weeeopen.polito.it\/en\/elettronica\/embed\/#?secret=Bb4IQYuuWP\" width=\"600\" height=\"338\" title=\"&#8220;Elettronica&#8221; &#8212; WEEE Open\" data-secret=\"Bb4IQYuuWP\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\" class=\"wp-embedded-content\"><\/iframe><script>\n\/*! This file is auto-generated *\/\n!function(d,l){\"use strict\";l.querySelector&&d.addEventListener&&\"undefined\"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!\/[^a-zA-Z0-9]\/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret=\"'+t.secret+'\"]'),o=l.querySelectorAll('blockquote[data-secret=\"'+t.secret+'\"]'),c=new RegExp(\"^https?:$\",\"i\"),i=0;i<o.length;i++)o[i].style.display=\"none\";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute(\"style\"),\"height\"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):\"link\"===t.message&&(r=new URL(s.getAttribute(\"src\")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener(\"message\",d.wp.receiveEmbedMessage,!1),l.addEventListener(\"DOMContentLoaded\",function(){for(var e,t,s=l.querySelectorAll(\"iframe.wp-embedded-content\"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute(\"data-secret\"))||(t=Math.random().toString(36).substring(2,12),e.src+=\"#?secret=\"+t,e.setAttribute(\"data-secret\",t)),e.contentWindow.postMessage({message:\"ready\",secret:t},\"*\")},!1)))}(window,document);\n\/\/# sourceURL=https:\/\/weeeopen.polito.it\/wp-includes\/js\/wp-embed.min.js\n<\/script>","description":"Tester RAM Il Tester RAM, detto anche ARANCINA, \u00e8 uno strumento hardware che permette di effettuare test funzionali su singoli stick di memoria. Il dispositivo consente di ottenere informazioni sulle caratteristiche e lo stato di usura delle memorie tramite una serie di procedure di prova pi\u00f9 o meno complesse (scritture\/letture ripetute, analisi del tempo di [&hellip;]","thumbnail_url":"https:\/\/weeeopen.polito.it\/wp-content\/uploads\/2021\/04\/ramtester.jpg"}